"A 5800 μm² Process Monitor Circuit for Measurement of in-Die ..."

Liron Lisha, Ori Bass, Joseph Shor (2021)

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DOI: 10.1109/TCSII.2020.3020945

access: closed

type: Journal Article

metadata version: 2021-06-15

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Liron Lisha, Ori Bass, Joseph Shor:
A 5800 μm² Process Monitor Circuit for Measurement of in-Die Variation of V_th in 65nm. IEEE Trans. Circuits Syst. II Express Briefs 68(3): 863-867 (2021)

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