"Reconfigurable Multi-Bit Scan Flip-Flop for Cell-Aware Diagnosis."

Hyeonchan Lim, Tae-Hyun Kim, Sungho Kang (2024)

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DOI: 10.1109/TCSII.2023.3332082

access: closed

type: Journal Article

metadata version: 2024-04-15

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Hyeonchan Lim, Tae-Hyun Kim, Sungho Kang:
Reconfigurable Multi-Bit Scan Flip-Flop for Cell-Aware Diagnosis. IEEE Trans. Circuits Syst. II Express Briefs 71(4): 2024-2028 (2024)

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