"A New Zero-Overhead Test Method for Low-Power AI Accelerators."

Sangjun Lee et al. (2024)

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DOI: 10.1109/TCSII.2023.3344696

access: closed

type: Journal Article

metadata version: 2024-06-18

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Sangjun Lee, Jongho Park, Sungwhan Park, Hyemin Kim, Sungho Kang:
A New Zero-Overhead Test Method for Low-Power AI Accelerators. IEEE Trans. Circuits Syst. II Express Briefs 71(5): 2649-2653 (2024)

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