"Shift Left Quality Management System (QMS) Using a 3-D Matrix Scanning ..."

Yong Lee, Seokjun Jang, Sungho Kang (2023)

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DOI: 10.1109/TCSII.2022.3216346

access: closed

type: Journal Article

metadata version: 2024-02-27

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Yong Lee, Seokjun Jang, Sungho Kang:
Shift Left Quality Management System (QMS) Using a 3-D Matrix Scanning Method on System on a Chip. IEEE Trans. Circuits Syst. II Express Briefs 70(4): 1580-1584 (2023)

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