"Reliable Test Architecture With Test Cost Reduction for Systolic-Based DNN ..."

Muhammad Ibtesam et al. (2022)

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DOI: 10.1109/TCSII.2021.3108415

access: closed

type: Journal Article

metadata version: 2022-04-01

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Muhammad Ibtesam, Umair Saeed Solangi, Jinuk Kim, Muhammad Adil Ansari, Sungju Park:
Reliable Test Architecture With Test Cost Reduction for Systolic-Based DNN Accelerators. IEEE Trans. Circuits Syst. II Express Briefs 69(3): 1537-1541 (2022)

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