"A Bypassable Scan Flip-Flop for Low Power Testing With Data Retention ..."

Xugang Cao, Hailong Jiao, Erik Jan Marinissen (2022)

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DOI: 10.1109/TCSII.2021.3096885

access: closed

type: Journal Article

metadata version: 2022-02-08

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Xugang Cao, Hailong Jiao, Erik Jan Marinissen:
A Bypassable Scan Flip-Flop for Low Power Testing With Data Retention Capability. IEEE Trans. Circuits Syst. II Express Briefs 69(2): 554-558 (2022)

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