"Voltage Boosted Fail Detecting Circuit for Selective Write Assist and Cell ..."

Jaehyun Park, Sangheon Lee, Hanwool Jeong (2023)

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DOI: 10.1109/TCSI.2022.3226464

access: closed

type: Journal Article

metadata version: 2024-08-28

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Jaehyun Park, Sangheon Lee, Hanwool Jeong:
Voltage Boosted Fail Detecting Circuit for Selective Write Assist and Cell Current Boosting for High-Density Low-Power SRAM. IEEE Trans. Circuits Syst. I Regul. Pap. 70(2): 797-805 (2023)

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