"On the Resiliency of NCFET Circuits Against Voltage Over-Scaling."

Guilherme Paim et al. (2021)

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DOI: 10.1109/TCSI.2021.3058451

access: closed

type: Journal Article

metadata version: 2022-04-06

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Guilherme Paim, Georgios Zervakis, Girish Pahwa, Yogesh Singh Chauhan, Eduardo Antonio Cesar da Costa, Sergio Bampi, Jörg Henkel, Hussam Amrouch:
On the Resiliency of NCFET Circuits Against Voltage Over-Scaling. IEEE Trans. Circuits Syst. I Regul. Pap. 68(4): 1481-1492 (2021)

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