"Knowledge Transfer Framework for PVT Robustness in Analog Integrated Circuits."

Jintao Li et al. (2024)

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DOI: 10.1109/TCSI.2023.3340683

access: closed

type: Journal Article

metadata version: 2024-08-13

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Jintao Li, Yanhan Zeng, Haochang Zhi, Jingci Yang, Weiwei Shan, Yongfu Li, Yun Li:
Knowledge Transfer Framework for PVT Robustness in Analog Integrated Circuits. IEEE Trans. Circuits Syst. I Regul. Pap. 71(5): 2017-2030 (2024)

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