"Cross-Layer Reliability Modeling of Dual-Port FeFET: Device-Algorithm ..."

Shubham Kumar et al. (2023)

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DOI: 10.1109/TCSI.2023.3265427

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type: Journal Article

metadata version: 2023-07-13

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Shubham Kumar, Swetaki Chatterjee, Simon Thomann, Yogesh Singh Chauhan, Hussam Amrouch:
Cross-Layer Reliability Modeling of Dual-Port FeFET: Device-Algorithm Interaction. IEEE Trans. Circuits Syst. I Regul. Pap. 70(7): 2891-2903 (2023)

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