"Statistical Observations of Three Co-Existing NBTI Behaviors in 28 nm HKMG ..."

Yarong Fu et al. (2022)

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DOI: 10.1109/TCSI.2022.3206448

access: closed

type: Journal Article

metadata version: 2023-01-15

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Yarong Fu, Wang Wang, Xin Zhong, Manni Li, Zixu Li, Qing Dong, Yu Jiang, Yinyin Lin:
Statistical Observations of Three Co-Existing NBTI Behaviors in 28 nm HKMG by On-Chip Monitor With Less Recovery Impact. IEEE Trans. Circuits Syst. I Regul. Pap. 69(12): 5185-5194 (2022)

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