"Low-Overhead Triple-Node-Upset Self-Recoverable Latch Design for ..."

Xin Chen et al. (2024)

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DOI: 10.1109/TCSI.2024.3382988

access: closed

type: Journal Article

metadata version: 2024-09-06

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Xin Chen, Yuxin Bai, Hao Cai, Congyi Zhu, Xinjie Zhou, Ying Zhang, Weiqiang Liu:
Low-Overhead Triple-Node-Upset Self-Recoverable Latch Design for Ultra-Dynamic Voltage Scaling Application. IEEE Trans. Circuits Syst. I Regul. Pap. 71(6): 2632-2645 (2024)

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