"Low-Overhead Triple-Node-Upset Self-Recoverable Latch Design for ..."

Xin Chen et al. (2024)

> Home

Details and statistics

DOI: 10.1109/TCSI.2024.3382988

access: closed

type: Journal Article

metadata version: 2024-12-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcasI/ChenBCZZZL24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcasI/ChenBCZZZL24
Xin Chen, Yuxin Bai, Hao Cai, Congyi Zhu, Xinjie Zhou, Ying Zhang, Weiqiang Liu:
Low-Overhead Triple-Node-Upset Self-Recoverable Latch Design for Ultra-Dynamic Voltage Scaling Application. IEEE Trans. Circuits Syst. I Regul. Pap. 71(6): 2632-2645 (2024)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.