"Methodology of Statistical RTS Noise Analysis With Charge-Carrier Trapping ..."

Tong Boon Tang, Alan F. Murray, Scott Roy (2010)

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DOI: 10.1109/TCSI.2010.2043988

access: closed

type: Journal Article

metadata version: 2020-05-22

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Tong Boon Tang, Alan F. Murray, Scott Roy:
Methodology of Statistical RTS Noise Analysis With Charge-Carrier Trapping Models. IEEE Trans. Circuits Syst. I Regul. Pap. 57-I(5): 1062-1070 (2010)

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