"CNFET With Process Imperfection: Impact on Circuit-Level Yield and Device ..."

Kaship Sheikh, Shu-Jen Han, Lan Wei (2016)

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DOI: 10.1109/TCSI.2016.2617828

access: closed

type: Journal Article

metadata version: 2021-10-01

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Kaship Sheikh, Shu-Jen Han, Lan Wei:
CNFET With Process Imperfection: Impact on Circuit-Level Yield and Device Optimization. IEEE Trans. Circuits Syst. I Regul. Pap. 63-I(12): 2209-2221 (2016)

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