"A 40 nm CMOS I/O Pad Design With Embedded Capacitive Coupling Receiver for ..."

Eleonora Franchi Scarselli et al. (2015)

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DOI: 10.1109/TCSI.2015.2441964

access: closed

type: Journal Article

metadata version: 2020-05-22

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Eleonora Franchi Scarselli, Luca Perilli, Luca Perugini, Roberto Canegallo:
A 40 nm CMOS I/O Pad Design With Embedded Capacitive Coupling Receiver for Non-Contact Wafer Probe Test. IEEE Trans. Circuits Syst. I Regul. Pap. 62-I(7): 1737-1746 (2015)

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