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"Pathological Element-Based Active Device Models and Their Application to ..."

Carlos Sánchez-López et al. (2011)

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DOI: 10.1109/TCSI.2010.2097696

access: closed

type: Journal Article

metadata version: 2020-10-15

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Carlos Sánchez-López, Francisco V. Fernández, Esteban Tlelo-Cuautle, Sheldon X.-D. Tan:
Pathological Element-Based Active Device Models and Their Application to Symbolic Analysis. IEEE Trans. Circuits Syst. I Regul. Pap. 58-I(6): 1382-1395 (2011)

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