default search action
"Lithography Options for the 32 nm Half Pitch Node and Beyond."
Kurt Ronse et al. (2009)
- Kurt Ronse, Philippe Jansen, Roel Gronheid, Eric Hendrickx, Mireille Maenhoudt, Vincent Wiaux, Mieke Goethals, R. Jonckheere, Geert Vandenberghe:
Lithography Options for the 32 nm Half Pitch Node and Beyond. IEEE Trans. Circuits Syst. I Regul. Pap. 56-I(8): 1884-1891 (2009)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.