"Analysis of Residue Integration Sampling With Improved Jitter Immunity."

Taehwan Oh et al. (2011)

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DOI: 10.1109/TCSII.2011.2158273

access: closed

type: Journal Article

metadata version: 2020-05-27

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Taehwan Oh, Nima Maghari, David Gubbins, Un-Ku Moon:
Analysis of Residue Integration Sampling With Improved Jitter Immunity. IEEE Trans. Circuits Syst. II Express Briefs 58-II(7): 417-421 (2011)

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