"EMI-Related Common-Mode (CM) Noise Analysis and Prediction of High-Speed ..."

Khawaja Qasim Maqbool et al. (2018)

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DOI: 10.1109/TCSII.2017.2708158

access: closed

type: Journal Article

metadata version: 2020-05-27

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Khawaja Qasim Maqbool, Duona Luo, Xingyun Luo, Huichun Yu, C. Patrick Yue:
EMI-Related Common-Mode (CM) Noise Analysis and Prediction of High-Speed Source-Series Terminated (SST) I/O Driver in System-on-Package (SOP). IEEE Trans. Circuits Syst. II Express Briefs 65-II(4): 446-450 (2018)

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