"Reexamination of SRAM Cell Write Margin Definitions in View of Predicting ..."

Hiroshi Makino et al. (2011)

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DOI: 10.1109/TCSII.2011.2124531

access: closed

type: Journal Article

metadata version: 2024-10-06

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Hiroshi Makino, Shunji Nakata, Hirotsugu Suzuki, Shin'ichiro Mutoh, Masayuki Miyama, Tsutomu Yoshimura, Shuhei Iwade, Yoshio Matsuda:
Reexamination of SRAM Cell Write Margin Definitions in View of Predicting the Distribution. IEEE Trans. Circuits Syst. II Express Briefs 58-II(4): 230-234 (2011)

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