"Capacitor-Coupled Built-Off Self-Test in Analog and Mixed-Signal Embedded ..."

Byoungho Kim, Jacob A. Abraham (2013)

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DOI: 10.1109/TCSII.2013.2251953

access: closed

type: Journal Article

metadata version: 2020-05-27

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Byoungho Kim, Jacob A. Abraham:
Capacitor-Coupled Built-Off Self-Test in Analog and Mixed-Signal Embedded Systems. IEEE Trans. Circuits Syst. II Express Briefs 60-II(5): 257-261 (2013)

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