"Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits."

Byoungho Kim, Jacob A. Abraham (2011)

> Home

Details and statistics

DOI: 10.1109/TCSI.2011.2106030

access: closed

type: Journal Article

metadata version: 2020-05-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcas/KimA11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcas/KimA11
Byoungho Kim, Jacob A. Abraham:
Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits. IEEE Trans. Circuits Syst. I Regul. Pap. 58-I(8): 1773-1784 (2011)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.