"On-Chip Measurement of Rise/Fall Gate Delay Using Reconfigurable Ring ..."

Bishnu Prasad Das, Hidetoshi Onodera (2014)

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DOI: 10.1109/TCSII.2013.2296118

access: closed

type: Journal Article

metadata version: 2020-05-27

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Bishnu Prasad Das, Hidetoshi Onodera:
On-Chip Measurement of Rise/Fall Gate Delay Using Reconfigurable Ring Oscillator. IEEE Trans. Circuits Syst. II Express Briefs 61-II(3): 183-187 (2014)

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