"Highly Reliable Two-Step Charge-Pump Read Scheme for 1.5 F2/Bit ..."

Tsai-Kan Chien et al. (2018)

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DOI: 10.1109/TCSII.2017.2778246

access: closed

type: Journal Article

metadata version: 2020-05-27

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Tsai-Kan Chien, Lih-Yih Chiou, Chi-Shian Chang, Jing-Yu Huang, Chung-Han Wu, Heng-Yuan Lee, Shyh-Shyuan Sheu:
Highly Reliable Two-Step Charge-Pump Read Scheme for 1.5 F²/Bit Nonlinear Sub-Teraohm 0TNR Vertical ReRAM. IEEE Trans. Circuits Syst. II Express Briefs 65-II(9): 1234-1238 (2018)

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