"Addressing Failure and Aging Degradation in MRAM/MeRAM-on-FDSOI Integration."

Hao Cai et al. (2019)

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DOI: 10.1109/TCSI.2018.2854277

access: closed

type: Journal Article

metadata version: 2024-12-11

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Hao Cai, You Wang, Lirida Alves de Barros Naviner, Xinning Liu, Weiwei Shan, Jun Yang, Weisheng Zhao:
Addressing Failure and Aging Degradation in MRAM/MeRAM-on-FDSOI Integration. IEEE Trans. Circuits Syst. I Regul. Pap. 66-I(1): 239-250 (2019)

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