"SeMIA: Self-Similarity-Based IC Integrity Analysis."

Yu Zheng, Shuo Yang, Swarup Bhunia (2016)

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DOI: 10.1109/TCAD.2015.2449231

access: closed

type: Journal Article

metadata version: 2024-05-07

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Yu Zheng, Shuo Yang, Swarup Bhunia:
SeMIA: Self-Similarity-Based IC Integrity Analysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(1): 37-48 (2016)

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