"Robust Wafer Classification With Imperfectly Labeled Data Based on ..."

Shuo Zhao et al. (2023)

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DOI: 10.1109/TCAD.2022.3218239

access: closed

type: Journal Article

metadata version: 2023-07-07

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Shuo Zhao, Zikun Zhu, Xin Li, Ying-Chi Chen:
Robust Wafer Classification With Imperfectly Labeled Data Based on Self-Boosting Co-Teaching. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(7): 2214-2226 (2023)

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