"Dynamically partitioned test scheduling with adaptive TAM configuration ..."

Dan Zhao, Shambhu J. Upadhyaya (2005)

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DOI: 10.1109/TCAD.2005.847893

access: closed

type: Journal Article

metadata version: 2020-09-24

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Dan Zhao, Shambhu J. Upadhyaya:
Dynamically partitioned test scheduling with adaptive TAM configuration for power-constrained SoC testing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(6): 956-965 (2005)

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