"Virtual Probe: A Statistical Framework for Low-Cost Silicon ..."

Wangyang Zhang et al. (2011)

> Home

Details and statistics

DOI: 10.1109/TCAD.2011.2164536

access: closed

type: Journal Article

metadata version: 2024-03-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcad/ZhangLLARB11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcad/ZhangLLARB11
Wangyang Zhang, Xin Li, Frank Liu, Emrah Acar, Rob A. Rutenbar, Ronald D. Blanton:
Virtual Probe: A Statistical Framework for Low-Cost Silicon Characterization of Nanoscale Integrated Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(12): 1814-1827 (2011)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.