"NBTI and HCI Aging Prediction and Reliability Screening During Production ..."

Liting Yu et al. (2020)

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DOI: 10.1109/TCAD.2019.2961329

access: closed

type: Journal Article

metadata version: 2022-09-26

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Liting Yu, Jianguo Ren, Xian Lu, Xiaoxiao Wang:
NBTI and HCI Aging Prediction and Reliability Screening During Production Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(10): 3000-3011 (2020)

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