"Statistical Performance Modeling and Parametric Yield Estimation of MOS VLSI."

Tat-Kwan Yu et al. (1987)

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DOI: 10.1109/TCAD.1987.1270342

access: closed

type: Journal Article

metadata version: 2020-09-24

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Tat-Kwan Yu, Sung-Mo Kang, I. N. Haji, Timothy N. Trick:
Statistical Performance Modeling and Parametric Yield Estimation of MOS VLSI. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 6(6): 1013-1022 (1987)

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