"Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep ..."

Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor (2010)

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DOI: 10.1109/TCAD.2010.2043591

access: closed

type: Journal Article

metadata version: 2022-01-03

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Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor:
Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(5): 760-773 (2010)

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