"Power and Thermal Constrained Test Scheduling Under Deep Submicron ..."

Chunhua Yao, Kewal K. Saluja, Parameswaran Ramanathan (2011)

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DOI: 10.1109/TCAD.2010.2079350

access: closed

type: Journal Article

metadata version: 2020-09-24

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Chunhua Yao, Kewal K. Saluja, Parameswaran Ramanathan:
Power and Thermal Constrained Test Scheduling Under Deep Submicron Technologies. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(2): 317-322 (2011)

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