"Reliable State Retention-Based Embedded Processors Through Monitoring and ..."

Sheng Yang et al. (2011)

> Home

Details and statistics

DOI: 10.1109/TCAD.2011.2166590

access: closed

type: Journal Article

metadata version: 2023-05-15

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcad/YangKAFI11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcad/YangKAFI11
Sheng Yang, S. Saqib Khursheed, Bashir M. Al-Hashimi, David Flynn, Sachin Idgunji:
Reliable State Retention-Based Embedded Processors Through Monitoring and Recovery. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(12): 1773-1785 (2011)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.