"Multiple distributions for biased random test patterns."

Hans-Joachim Wunderlich (1990)

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DOI: 10.1109/43.55187

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type: Journal Article

metadata version: 2020-09-24

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Hans-Joachim Wunderlich:
Multiple distributions for biased random test patterns. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 9(6): 584-593 (1990)

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