"Testing ASICs with multiple identical cores."

Yuejian Wu, Paul N. MacDonald (2003)

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DOI: 10.1109/TCAD.2002.807889

access: closed

type: Journal Article

metadata version: 2020-09-24

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Yuejian Wu, Paul N. MacDonald:
Testing ASICs with multiple identical cores. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(3): 327-336 (2003)

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