"A Fuzzy-Matching Model With Grid Reduction for Lithography Hotspot Detection."

Wan-Yu Wen et al. (2014)

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DOI: 10.1109/TCAD.2014.2351273

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type: Journal Article

metadata version: 2025-03-03

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Wan-Yu Wen, Jin-Cheng Li, Sheng-Yuan Lin, Jing-Yi Chen, Shih-Chieh Chang:
A Fuzzy-Matching Model With Grid Reduction for Lithography Hotspot Detection. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(11): 1671-1680 (2014)

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