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"An automatic test pattern generator for minimizing switching activity ..."

Seongmoon Wang, Sandeep K. Gupta (2002)

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DOI: 10.1109/TCAD.2002.800460

access: closed

type: Journal Article

metadata version: 2023-09-22

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Seongmoon Wang, Sandeep K. Gupta:
An automatic test pattern generator for minimizing switching activity during scan testing activity. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(8): 954-968 (2002)

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