"Managing Test Coverage Uncertainty due to Random Noise in Nano-CMOS: A ..."

Vikram B. Suresh, Sandip Kundu (2016)

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DOI: 10.1109/TCAD.2015.2449236

access: closed

type: Journal Article

metadata version: 2020-09-24

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Vikram B. Suresh, Sandip Kundu:
Managing Test Coverage Uncertainty due to Random Noise in Nano-CMOS: A Case-Study on an SRAM Array. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(1): 155-165 (2016)

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