"Characterizing the LSI Yield Equation from Wafer Test Data."

Sharad C. Seth, Vishwani D. Agrawal (1984)

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DOI: 10.1109/TCAD.1984.1270065

access: closed

type: Journal Article

metadata version: 2020-09-24

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Sharad C. Seth, Vishwani D. Agrawal:
Characterizing the LSI Yield Equation from Wafer Test Data. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 3(2): 123-126 (1984)

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