"Skewed Flip-Flop and Mixed-Vt Gates for Minimizing Leakage in ..."

Jun Seomun, Jae-Hyun Kim, Youngsoo Shin (2008)

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DOI: 10.1109/TCAD.2008.2006084

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/SeomunKS08
Jun Seomun, Jae-Hyun Kim, Youngsoo Shin:
Skewed Flip-Flop and Mixed-V_t Gates for Minimizing Leakage in Sequential Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(11): 1956-1968 (2008)

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