"Data-Driven Reliability Models of Quantum Circuit: From Traditional ML to ..."

Vedika Saravanan, Samah Mohamed Saeed (2023)

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DOI: 10.1109/TCAD.2022.3202430

access: closed

type: Journal Article

metadata version: 2023-04-29

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Vedika Saravanan, Samah Mohamed Saeed:
Data-Driven Reliability Models of Quantum Circuit: From Traditional ML to Graph Neural Network. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(5): 1477-1489 (2023)

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