"Modeling the Dependency of Analog Circuit Performance Parameters on ..."

Elena-Diana Sandru et al. (2022)

> Home

Details and statistics

DOI: 10.1109/TCAD.2021.3054804

access: closed

type: Journal Article

metadata version: 2024-10-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcad/SandruDKBBP22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcad/SandruDKBBP22
Elena-Diana Sandru, Emilian David, Ingrid Kovacs, Andi Buzo, Corneliu Burileanu, Georg Pelz:
Modeling the Dependency of Analog Circuit Performance Parameters on Manufacturing Process Variations With Applications in Sensitivity Analysis and Yield Prediction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(1): 129-142 (2022)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.