"Finite memory test response compactors for embedded test applications."

Janusz Rajski et al. (2005)

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DOI: 10.1109/TCAD.2005.844111

access: closed

type: Journal Article

metadata version: 2020-09-24

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Janusz Rajski, Jerzy Tyszer, Chen Wang, Sudhakar M. Reddy:
Finite memory test response compactors for embedded test applications. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(4): 622-634 (2005)

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