"Predicting X-Sensitivity of Circuit-Inputs on Test-Coverage: A ..."

Manjari Pradhan et al. (2019)

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DOI: 10.1109/TCAD.2018.2878169

access: closed

type: Journal Article

metadata version: 2020-09-24

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Manjari Pradhan, Bhaswar B. Bhattacharya, Krishnendu Chakrabarty, Bhargab B. Bhattacharya:
Predicting X-Sensitivity of Circuit-Inputs on Test-Coverage: A Machine-Learning Approach. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(12): 2343-2356 (2019)

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