"Transparent scan: a new approach to test generation and test compaction ..."

Irith Pomeranz, Sudhakar M. Reddy (2003)

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DOI: 10.1109/TCAD.2003.819424

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type: Journal Article

metadata version: 2020-09-24

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Irith Pomeranz, Sudhakar M. Reddy:
Transparent scan: a new approach to test generation and test compaction for scan circuits that incorporates limited scan operations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(12): 1663-1670 (2003)

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