"A diagnostic test generation procedure based on test elimination byvector ..."

Irith Pomeranz, Sudhakar M. Reddy (2000)

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DOI: 10.1109/43.845083

access: closed

type: Journal Article

metadata version: 2020-09-24

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Irith Pomeranz, Sudhakar M. Reddy:
A diagnostic test generation procedure based on test elimination byvector omission for synchronous sequential circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19(5): 589-600 (2000)

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