"LFSR-Based Test Generation for Path Delay Faults."

Irith Pomeranz (2019)

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DOI: 10.1109/TCAD.2018.2812120

access: closed

type: Journal Article

metadata version: 2020-09-24

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Irith Pomeranz:
LFSR-Based Test Generation for Path Delay Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(2): 345-353 (2019)

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