"Efficient identification of (critical) testable path delay faults using ..."

Saravanan Padmanaban, Spyros Tragoudas (2005)

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DOI: 10.1109/TCAD.2004.839488

access: closed

type: Journal Article

metadata version: 2020-09-24

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Saravanan Padmanaban, Spyros Tragoudas:
Efficient identification of (critical) testable path delay faults using decision diagrams. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(1): 77-87 (2005)

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