"Information Entropy-Based Leakage Profiling."

Changhai Ou et al. (2021)

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DOI: 10.1109/TCAD.2020.3036810

access: closed

type: Journal Article

metadata version: 2021-06-01

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Changhai Ou, Xinping Zhou, Siew-Kei Lam, Chengju Zhou, Fangxin Ning:
Information Entropy-Based Leakage Profiling. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(6): 1052-1062 (2021)

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